Verification and validation of the THYTAN code for the graphite oxidation analysis in the HTGR systems

Shimazaki, Yosuke; Isaka, Kazuyoshi; Nomoto, Yasunobu; Seki, Tomokazu; Ohashi, Hirofumi

JAEA-Technology 2014-038, 51 Pages, 2014/12

JAEA-Technology-2014-038.pdf:3.84MB

The analytical models for the evaluation of graphite oxidation were implemented into the THYTAN code, which employs the mass balance and a node-link computational scheme to evaluate tritium behavior in the High Temperature Gas-cooled Reactor (HTGR) systems for hydrogen production, to analyze the graphite oxidation during the air or water ingress accidents in the HTGR systems. This report describes the analytical models of the THYTAN code in terms of the graphite oxidation analysis and its verification and validation (V&V) results. Mass transfer from the gas mixture in the coolant channel to the graphite surface, diffusion in the graphite, graphite oxidation by air or water, chemical reaction and release from the primary circuit to the containment vessel by a safety valve were modeled to calculate the mass balance in the graphite and the gas mixture in the coolant channel. The computed solutions using the THYTAN code for simple questions were compared to the analytical results by a hand calculation to verify the algorithms for each implemented analytical model. A representation of the graphite oxidation experimental was analyzed using the THYTAN code, and the results were compared to the experimental data and the computed solutions using the GRACE code, which was used for the safety analysis of the High Temperature Engineering Test Reactor (HTTR), in regard to corrosion depth of graphite and oxygen concentration at the outlet of the test section to validate the analytical models of the THYTAN code. The comparison of THYTAN code results with the analytical solutions, experimental data and the GRACE code results showed the good agreement.

Safety evaluation of High Temperature Engineering Test Reactor

*; Ohashi, Kazutaka*; *; *; Sawa, Kazuhiro; Nakagawa, Shigeaki; Kunitomi, Kazuhiko

FAPIG, 0(127), p.11 - 19, 1991/03

no abstracts in English